Characterization of thermoelectric elements and devices by impedance spectroscopy

TitleCharacterization of thermoelectric elements and devices by impedance spectroscopy
Publication TypeJournal Article
Year of Publication2007
AuthorsDowney AD, Hogan TP, Cook B
Journal TitleReview of Scientific Instruments
Volume78
Pages093904
Date PublishedSep
Type of ArticleArticle
ISBN Number0034-6748
Accession NumberISI:000249787800020
KeywordsDIFFUSIVITY, FIGURE, HARMAN METHOD, merit, thermal-conductivity
Abstract

This article describes a new measurement technique that utilizes impedance spectroscopy for the characterization of thermoelectric materials and devices. Two circuit models were developed and used to help explain the impedance spectroscopy data using transmission line theory and a coupled electrothermal model. Two testing configurations have been investigated including one based on a sinusoidal source (ac lock-in technique) and one based on a pulsed wave source. Methods for reducing the measurement times for this technique are discussed. In addition, the influence of radiation losses on this measurement technique has also been analyzed to further understand the limitations of this technique at higher temperatures. (c) 2007 American Institute of Physics.

DOI10.1063/1.2775432
Alternate JournalRev. Sci. Instrum.