Growth of Bi thin films on quasicrystal surfaces

TitleGrowth of Bi thin films on quasicrystal surfaces
Publication TypeJournal Article
Year of Publication2008
AuthorsSharma HR, Fournee V, Shimoda M, Ross AR, Lograsso TA, Gille P, Tsai AP
Journal TitlePhysical Review B
Volume78
Pages155416
Date Published10/01
Type of ArticleArticle
ISBN Number1098-0121
Accession NumberISI:000260574400124
Keywordsag, AL-CU-FE, energy, fivefold surface, nucleation, photoemission, refinement
Abstract

We present a comprehensive study of Bi thin-film growth on quasicrystal surfaces. The substrates used for the growth are the fivefold surface of icosahedral (i)-Al-Cu-Fe and i-Al-Pd-Mn and the tenfold surface of decagonal (d)-Al-Ni-Co quasicrystals. The growth is investigated at 300 and 525 K substrate temperatures and at different coverage (theta) ranging from submonolayer to ten monolayers. The film is characterized by scanning tunneling microscopy, reflection high-energy electron diffraction, and x-ray photoelectron spectroscopy. At 300 K, the deposited Bi yields a quasicrystalline film for theta <= 1. For 1

DOI10.1103/PhysRevB.78.155416
Alternate JournalPhys. Rev. B