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X-Ray diffraction on large single crystals using a powder diffractometer

TitleX-Ray diffraction on large single crystals using a powder diffractometer
Publication TypeJournal Article
Year of Publication2016
AuthorsJesche, A, Fix, M, Kreyssig, A, Meier, WR, Canfield, PC
JournalPhilosophical Magazine
Volume96
Pagination2115-2124
Date Published06
Type of ArticleArticle
ISBN Number1478-6435
Accession NumberWOS:000379850400003
Keywordslattice parameter determination, Materials Science, mechanics, Metallurgical Engineering, physics, powder diffractometer, silicon, Single crystal, X-ray diffraction
Abstract

s rule. Here we present a guide to accurate measurements of single crystals with dimensions ranging from 200m up to several millimetres using a standard powder diffractometer in Bragg-Brentano geometry. The correction of the error introduced by the sample height and the optimisation of the alignment are discussed in detail. In particular for single crystals with a plate-like habit, the described procedure allows for measurement of the lattice spacings normal to the plates with high accuracy on a timescale of minutes.

DOI10.1080/14786435.2016.1192725
Custom 1

Complex States

Alternate JournalPhilos. Mag.