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Structural evolution of the Pb/Si(111) interface with metal overlayer thickness

TitleStructural evolution of the Pb/Si(111) interface with metal overlayer thickness
Publication TypeJournal Article
Year of Publication2015
AuthorsSouto-Casares, J, Chan, TL, Chelikowsky, JR, Ho, KM, Wang, CZ, Zhang, SB
JournalPhysical Review B
Volume92
Pagination094103
Date Published09
Type of ArticleArticle
ISBN Number1098-0121
Accession NumberWOS:000361036900001
Keywordsconsistent-field calculations, electronic-structure calculations, films, growth, low-temperatures, nanostructures, pb, scattering, schottky-barrier, si(111)
Abstract

an a few monolayers), where the corrugation is strong, and the bulk region (more than a half-dozen layers), where the overlaid Pb film is atomically flat. This work proves the feasibility of handling systems with such a level of complexity.

DOI10.1103/PhysRevB.92.094103
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Surface Structures

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Exploratory Theory