|Title||Scanning angle Raman spectroscopy measurements of thin polymer films for thickness and composition analyses|
|Publication Type||Journal Article|
|Year of Publication||2013|
|Authors||Meyer, MW, Nguyen, VHT, Smith, EA|
|Type of Article||Article|
|Keywords||fields, integrated-optics, optical-wave-guides, Polystyrene films, Radiative polymer waveguide, resonance, Thickness calibration curve, Total internal reflection, vibrational spectroscopy|
ich is the angle with the highest integrated optical energy density. The film thicknesses measured by SA Raman spectroscopy ranged from less than 400 nm to 1.8 mu m. The average percent uncertainty in the SA Raman determinations for all films was 4%, and the measurements agreed with those obtained from optical interferometery within the experimental uncertainty for all but two films. For the 1270-nm and 580-nm polystyrene films, the SA Raman measurements overestimated the film thickness by 5 and 18%, respectively. The dependence of the calibration curve on excitation polarization and composition of the polymer and bulk layers was evaluated. This preliminary investigation demonstrates that scanning angle Raman spectroscopy is a versatile method applicable whenever the chemical composition and thickness of interfacial polymer layers needs to be measured. (c) 2012 Elsevier B.V. All rights reserved.
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