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Growth and characterisation of Gd-5(SixGe1-x)(4) thin film

TitleGrowth and characterisation of Gd-5(SixGe1-x)(4) thin film
Publication TypeJournal Article
Year of Publication2013
AuthorsHadimani, RL, Nlebedim, IC, Melikhov, Y, Jiles, DC
JournalJournal of Applied Physics
Date Published05
Type of ArticleArticle; Proceedings Paper
ISBN Number0021-8979
Accession NumberWOS:000319292800080
Keywordsfield, magnetic refrigeration, room-temperature, transition

mposition. X-Ray Diffraction analysis confirmed the presence of Gd5Si2Ge2 monoclinic structure. Magnetic moment vs. magnetic field measurement confirmed that the film was ferromagnetic at a temperature of 200 K. The transition temperature of the film was determined from a plot of magnetic moment vs. temperature. The transition temperature was between 280 and 300 K which is close to the transition temperature of the bulk material. (C) 2013 American Institute of Physics.

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