|Title||Fourier Transform-Plasmon Waveguide Spectroscopy: A Nondestructive Multifrequency Method for Simultaneously Determining Polymer Thickness and Apparent Index of Refraction|
|Publication Type||Journal Article|
|Year of Publication||2014|
|Authors||Bobbitt, JM, Weibel, SC, Elshobaki, M, Chaudhary, S, Smith, EA|
|Type of Article||Article|
|Keywords||microscopy, real-time, resonance, sensitivity, ultrathin|
ng reflectivity for a range of frequencies extends the analysis to a wide variety of sample compositions and thicknesses since frequencies with the maximum attenuation can be selected to optimize the analysis. Additionally, the ability to measure reflectivity curves with both p- and s-polarized light provides anisotropic indices of refraction. FT-PWR is demonstrated using polystyrene waveguides of varying thickness, and the validity of FT-PWR measurements are verified by comparing the results to data from profilometry and atomic force microscopy (AFM).
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