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Fourier Transform-Plasmon Waveguide Spectroscopy: A Nondestructive Multifrequency Method for Simultaneously Determining Polymer Thickness and Apparent Index of Refraction

TitleFourier Transform-Plasmon Waveguide Spectroscopy: A Nondestructive Multifrequency Method for Simultaneously Determining Polymer Thickness and Apparent Index of Refraction
Publication TypeJournal Article
Year of Publication2014
AuthorsBobbitt, JM, Weibel, SC, Elshobaki, M, Chaudhary, S, Smith, EA
JournalAnalytical Chemistry
Volume86
Pagination11957-11961
Date Published12
Type of ArticleArticle
ISBN Number0003-2700
Accession NumberWOS:000346683900007
Keywordsmicroscopy, real-time, resonance, sensitivity, ultrathin
Abstract

ng reflectivity for a range of frequencies extends the analysis to a wide variety of sample compositions and thicknesses since frequencies with the maximum attenuation can be selected to optimize the analysis. Additionally, the ability to measure reflectivity curves with both p- and s-polarized light provides anisotropic indices of refraction. FT-PWR is demonstrated using polystyrene waveguides of varying thickness, and the validity of FT-PWR measurements are verified by comparing the results to data from profilometry and atomic force microscopy (AFM).

DOI10.1021/ac5041039g
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