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Evolution of optical properties of tin film from solid to liquid studied by spectroscopic ellipsometry and ab initio calculation

TitleEvolution of optical properties of tin film from solid to liquid studied by spectroscopic ellipsometry and ab initio calculation
Publication TypeJournal Article
Year of Publication2014
AuthorsZhang, DX, Shen, B, Zheng, YX, Wang, SY, Zhang, JB, Yang, SD, Zhang, RJ, Chen, LY, Wang, CZ, Ho, KM
JournalApplied Physics Letters
Volume104
Pagination121907
Date Published03
Type of ArticleArticle
ISBN Number0003-6951
Accession NumberWOS:000334078500025
Keywordsanalyzer, dependent melting properties, metals, molecular-dynamics, polarizer, scanning ellipsometer, thin, total-energy calculations, wave basis-set, white
Abstract

The temperature dependent optical properties of tin film from solid to liquid were studied by spectroscopic ellipsometry and ab initio molecular dynamics simulations. The dielectric function of liquid Sn was different from solid, and an interband transition near 1.5 eV was easily observed in solid while it apparently disappeared upon melting. From the evolution of optical properties with temperature, an optical measurement to acquire the melting point by ellipsometry was presented. From first principles calculation, we show that the local structure difference in solid and liquid is responsible for this difference in the optical properties observed in experiment. (C) 2014 AIP Publishing LLC.

DOI10.1063/1.4869722
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Exploratory Theory