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Density Profiles of Liquid/Vapor Interfaces Away from Their Critical Points

TitleDensity Profiles of Liquid/Vapor Interfaces Away from Their Critical Points
Publication TypeJournal Article
Year of Publication2014
AuthorsBu, W, Kim, D, Vaknin, D
JournalJournal of Physical Chemistry C
Volume118
Pagination12405-12409
Date Published06
Type of ArticleArticle
ISBN Number1932-7447
Accession NumberWOS:000337497400035
Keywordsfluctuations, fluid, free energy, interfaces, scattering, surface, thermal capillary waves, thickness, vapor interface, x-ray reflectivity
Abstract

We examine the applicability of various model profiles for the liquid/vapor interface by X-ray reflectivities on water and ethanol and their mixtures at room temperature. Analysis of the X-ray reflecivities using various density profiles shows an error-function like profile is the most adequate within experimental error. Our findings, together with recent observations from simulation studies on liquid surfaces, strongly suggest that the capillary-wave dynamics shapes the interfacial density profile in terms of the error function.

DOI10.1021/jp504374z
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