Microstructure dependence of the c-axis critical current density in second-generation YBCO tapes

TitleMicrostructure dependence of the c-axis critical current density in second-generation YBCO tapes
Publication TypeJournal Article
Year of Publication2011
AuthorsJia Y, Welp U, Crabtree GW, Kwok WK, Malozemoff AP, Rupich MW, Fleshler S, Clem JR
Journal TitleJournal of Applied Physics
Volume110
Pages083923
Date Published10
Type of ArticleArticle
ISBN Number0021-8979
Accession NumberWOS:000296519900105
Keywordscoated conductors, dy additions, flux-creep, high-temperature superconductors, ii superconductors, inhomogeneity, n-value, resistive transition, WIRES, yba2cu3o7-delta
Abstract

C-axis current flow in high temperature superconductor (HTS) tape-shaped wires arises in configurations where the local wire axis is not perpendicular to the local magnetic field, such as in power cables with helically wound HTS tapes. The c-axis critical current density J(c)(c) has been recently found to be orders of magnitude lower than the ab-plane critical current density J(c)(ab). Here we report on J(c)(c) (77 K, sf) values of various YBa(2)Cu(3)O(7)-based (YBCO) tapes with different microstructures. Our results show that the value of J(c)(c) (77 K, sf) decreases significantly with increasing concentration of ab-plane stacking faults in YBCO thin films and that the critical current anisotropy gamma = J(c)(ab)/J(c)(c) can reach values as high as 2070, implying that in the highest-anisotropy tape, similar to 20% of the tape width carries c-axis current in a helically wound power cable. VC 2011 American Institute of Physics. [doi:10.1063/1.3653292]

DOI10.1063/1.3653292
Alternate JournalJ. Appl. Phys.