Structural study of supercooled liquid silicon

TitleStructural study of supercooled liquid silicon
Publication TypeJournal Article
Year of Publication2008
AuthorsKim TH, Goldman AI, Kelton KF
Journal TitlePhilosophical Magazine
Volume88
Pages171-179
Type of ArticleArticle
ISBN Number1478-6435
Accession NumberISI:000252826400003
KeywordsAMORPHOUS-SILICON, bond-orientational order, CRYSTALLIZATION, ELECTROSTATIC LEVITATOR, glasses, molecular-dynamics, MOLTEN SILICON, simulations, temperature, x-ray-diffraction
Abstract

For many years, theoretical studies using model and ab initio potentials have predicated the existence of a liquid/liquid phase transition in silicon, based on a continuous change of the liquid A5 structure to A4. In contrast, we report here a quantitative analysis of data from high-energy X-ray diffraction measurements of containerlessly-processed supercooled liquid silicon that demonstrates that the fractions of regions with A5 and A4 order instead remain essentially constant with supercooling, but that the coherence length of the A5 order increases.

DOI10.1080/14786430701798944
Alternate JournalPhilos. Mag.