Charge-magnetic interference resonant scattering studies of ferromagnetic crystals and thin films

TitleCharge-magnetic interference resonant scattering studies of ferromagnetic crystals and thin films
Publication TypeJournal Article
Year of Publication2012
AuthorsHaskel D, Kravtsov E, Choi Y, Lang JC, Islam Z, Srajer G, Jiang JS, Bader SD, Canfield PC
Journal TitleEuropean Physical Journal-Special Topics
Volume208
Pages141-155
Date Published06
Type of ArticleReview
ISBN Number1951-6355
Accession NumberWOS:000305404200015
Keywordsdiffraction, exchange scattering, nd2fe14b, phase-transitions, polarization dependence, rough surfaces, superlattices, x-ray-scattering
Abstract

The element- and site-specificity of X-ray resonant magnetic scattering (XRMS) makes it an ideal tool for furthering our understanding of complex magnetic systems. In the hard X-rays, XRMS is readily applied to most antiferromagnets where the relatively weak resonant magnetic scattering (10(-2)-10(-6) I (c) ) is separated in reciprocal space from the stronger, Bragg charge scattered intensity, I (c) . In ferro(ferri)magnetic materials, however, such separation does not occur and measurements of resonant magnetic scattering in the presence of strong charge scattering are quite challenging. We discuss the use of charge-magnetic interference resonant scattering for studies of ferromagnetic (FM) crystals and layered films. We review the challenges and opportunities afforded by this approach, particularly when using circularly polarized X-rays. We illustrate current capabilities at the Advanced Photon Source with studies aimed at probing site-specific magnetism in ferromagnetic crystals, and interfacial magnetism in films.

URL<Go to ISI>://WOS:000305404200015
DOI10.1140/epjst/e2012-01615-2
Alternate JournalEur. Phys. J.-Spec. Top.