%0 Journal Article
%J Physical Review Letters
%D 2009
%T Efficient First-Principles Simulation of Noncontact Atomic Force Microscopy for Structural Analysis
%A Chan, T. L.
%A Wang, C. Z.
%A Ho, K. M.
%A Chelikowsky, J. R.
%K image
%K resolution
%K si(111)
%K tio2(110) surface
%K total-energy calculations
%M ISI:000265948300036
%P 176101
%R 10.1103/Physrevlett.102.176101
%U ://000265948300036
%V 102
%X We propose an efficient scheme to simulate noncontact atomic force microscopy images by using first-principles self-consistent potential from the sample as input without explicit modeling of the atomic force microscopy tip. Our method is applied to various types of semiconductor surfaces including Si(111)-(7 x 7), TiO2(110)-(1 x 1), Ag/Si(111)-(root 3 x root 3)R30 degrees, and Ge/Si(105)-(1 x 2) surfaces. We obtain good agreement with experimental results and previous theoretical studies, and our method can aid in identifying different structural models for surface reconstruction.
%Z 443ZCTimes Cited:1Cited References Count:35
%8 05/01
%@ 0031-9007